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Microanalytical Laboratory

Dept.of Earth and Planetary Sciences

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Dimension 3100 Atomic Force Microscope (AFM)

The Dimension 3100 Scanning Probe Microscope (SPM) utilizes automated atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200 mm in diameter. Its laser spot alignment system and the ability to change scanning techniques without tools guarantee flexibility, ease of use, and high product throughput. Check detail Specifications here.