Atomic force microscope (AFM) is an exciting new technique that allows surface to be imaged at higher resolutions and accuracies than ever before. Under certain conditions it is actually possible to image the atoms that make up the sample. It has been used in the fields of biology, electron engineering, chemistry, geology, aerospace, energy and automotive industries to study etching, growth, corrosion, polishing, friction and cleaning etc.. The materials imaged include polymers, semiconductors,minerals, ceramics, metals, glasses.
Welcome to Atomic Force Microscope (AFM)
Microanalytical Laboratory
Dept.of Earth and Planetary Sciences
